IN THIS TECHNICAL PAPER...

Learn about the different optical metrology solutions available to qualify an asphere during fabrication.

  • Functionality and methodology of the OptiTrace 5000 contact profilometer, UltraSurf non-contact metrology system, and PRO Tower vertical interferometer equipped with a CGH 
  • Read comparisons between the techniques with attention to accuracy, repeatability, and overall measurement time
  • See a cross-correlation of the measured surface error magnitude and shape
Contact and Non-Contact Asphere Metrology Devices

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Scott DeFisher, Edward M. Fess, "Comparison of contact and non-contact asphere surface metrology devices," Proc. SPIE 8884, Optifab 2013, 88840U (15 October 2013);

Copyright 2013 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

Read abstract: https://doi.org/10.1117/12.2029349


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