IN THIS TECHNICAL PAPER...

Learn about the different optical metrology solutions available to qualify an asphere during fabrication.

  • Functionality and methodology of the OptiTrace 5000 contact profilometer, UltraSurf non-contact metrology system, and PRO Tower vertical interferometer equipped with a CGH 
  • Read comparisons between the techniques with attention to accuracy, repeatability, and overall measurement time
  • See a cross-correlation of the measured surface error magnitude and shape
Contact and Non-Contact Asphere Metrology Devices

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