Learn about the different optical metrology solutions available to qualify an asphere during fabrication.
Functionality and methodology of the OptiTrace 5000 contact profilometer, UltraSurf non-contact metrology system, and PRO Tower vertical interferometer equipped with a CGH
Read comparisons between the techniques with attention to accuracy, repeatability, and overall measurement time
See a cross-correlation of the measured surface error magnitude and shape
Scott DeFisher, Edward M. Fess, "Comparison of contact and non-contact asphere surface metrology devices," Proc. SPIE 8884, Optifab 2013, 88840U (15 October 2013);
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