Learn about the different optical metrology solutions available to qualify an asphere during fabrication.
Scott DeFisher, Edward M. Fess, "Comparison of contact and non-contact asphere surface metrology devices," Proc. SPIE 8884, Optifab 2013, 88840U (15 October 2013);
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Read abstract: https://doi.org/10.1117/12.2029349
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