Learn how metrology capabilities on the UltraSurf make it possible to perform corrective grinding and polishing of freeform optics with confidence.
Scott DeFisher, James Ross, "Advancements in non-contact freeform metrology with datum structures," Proc. SPIE 11175, Optifab 2019, 1117515 (15 November 2019);
Copyright 2019 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
Read abstract: https://doi.org/10.1117/12.2535823
6368 Dean Parkway, Ontario, NY 14519
585-265-0160 | email@example.com